CHARACTERIZATION OF PHOTODEPOSITED SELENIUM PLANAR STRUCTURES BY SCANNING FORCE MICROSCOPY

Authors
PELED A BARANAUSKAS V RODRIGUES C ARTWEISMAN D GRANTMAN L FRIESEM AA
Citation
A. Peled et al., CHARACTERIZATION OF PHOTODEPOSITED SELENIUM PLANAR STRUCTURES BY SCANNING FORCE MICROSCOPY, Journal of applied physics, 77(12), 1995, pp. 6208-6213
Citations number
32
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
77
Issue
12
Year of publication
1995
Pages
6208 - 6213
Database
ISI
SICI code
0021-8979(1995)77:12<6208:COPSPS>2.0.ZU;2-M