THE EFFECT OF DEGRADATION OF DEPTH RESOLUTION ON THE INTERDIFFUSION DATA IN THIN POLYCRYSTALLINE AU-AG MULTILAYER FILMS

Authors
BUKALUK A
Citation
A. Bukaluk, THE EFFECT OF DEGRADATION OF DEPTH RESOLUTION ON THE INTERDIFFUSION DATA IN THIN POLYCRYSTALLINE AU-AG MULTILAYER FILMS, Surface review and letters, 2(2), 1995, pp. 191-196
Citations number
18
Categorie Soggetti
Physics, Condensed Matter","Physics, Atomic, Molecular & Chemical","Material Science
Journal title
Surface review and letters → ACNP
ISSN journal
0218625X
Volume
2
Issue
2
Year of publication
1995
Pages
191 - 196
Database
ISI
SICI code
0218-625X(1995)2:2<191:TEODOD>2.0.ZU;2-Y
Abstract
Auger electron spectroscopy (AES) in conjunction with argon-ion sputte ring was used to determine the diffusion profiles in the thin-film Au- Ag multilayer system. Interdiffusion coefficients, obtained in the tem perature rang of 175-250 degrees C, have been derived from the change of the concentration amplitude of the structure and from the variation of the composition at the interface of two consecutive layers of the multilayer system. The influence of the depth resolution on the diffus ion data have been analyzed and discussed.