A. Bukaluk, THE EFFECT OF DEGRADATION OF DEPTH RESOLUTION ON THE INTERDIFFUSION DATA IN THIN POLYCRYSTALLINE AU-AG MULTILAYER FILMS, Surface review and letters, 2(2), 1995, pp. 191-196
Auger electron spectroscopy (AES) in conjunction with argon-ion sputte
ring was used to determine the diffusion profiles in the thin-film Au-
Ag multilayer system. Interdiffusion coefficients, obtained in the tem
perature rang of 175-250 degrees C, have been derived from the change
of the concentration amplitude of the structure and from the variation
of the composition at the interface of two consecutive layers of the
multilayer system. The influence of the depth resolution on the diffus
ion data have been analyzed and discussed.