Interdiffusion kinetics were measured using x-ray diffraction methods
in epitaxial (001) and (111) Co/Pt multilayers in which the chemical m
odulation wavelength was in the range 2.5-4.0 nm. Multilayers were pre
pared by e-beam evaporation and were subsequently annealed in vacuum a
t temperatures between 275 and 375 degrees C. The activation enthalpy
of the interdiffusion process in this temperature range was estimated
using a novel approach for scaling nonlinear diffusion data. Activatio
n enthalpies for interdiffusion in (001) and (111) multilayers were de
termined to be 1.1+/-0.2 and 0.8+/-0.2 eV, respectively. The low value
s obtained for the activation enthalpies may result from coherency str
ains or ''short-circuit'' diffusion in the faulted, epitaxial multilay
ers. (C) 1997 American Institute of Physics.