SCANNING TUNNELING MICROSCOPE OF THE 16X2 RECONSTRUCTED SI(110) SURFACE

Authors
PACKARD WE DOW JD
Citation
We. Packard et Jd. Dow, SCANNING TUNNELING MICROSCOPE OF THE 16X2 RECONSTRUCTED SI(110) SURFACE, Journal of applied physics, 81(2), 1997, pp. 994-996
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
81
Issue
2
Year of publication
1997
Pages
994 - 996
Database
ISI
SICI code
0021-8979(1997)81:2<994:STMOT1>2.0.ZU;2-1
Abstract
The Si(110) surface, which is commonly employed for etching micro-mach ines, self-organizes into a ''16X2'' reconstruction or surface meso-cr ystal. A model of this surface crystal structure, based on scanning tu nneling microscopy measurements, is proposed. (C) 1997 American Instit ute of Physics.