IN-SITU TOTAL-ELECTRON-YIELD SULFUR K-EDGE XAFS MEASUREMENTS DURING EXPOSURE OF COPPER TO AN SO2-CONTAINING HUMID ATMOSPHERE

Citation
Ih. Song et al., IN-SITU TOTAL-ELECTRON-YIELD SULFUR K-EDGE XAFS MEASUREMENTS DURING EXPOSURE OF COPPER TO AN SO2-CONTAINING HUMID ATMOSPHERE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 360(3), 1995, pp. 634-641
Citations number
25
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
ISSN journal
01689002
Volume
360
Issue
3
Year of publication
1995
Pages
634 - 641
Database
ISI
SICI code
0168-9002(1995)360:3<634:ITSKXM>2.0.ZU;2-G
Abstract
A total-electron-yield (TEY) detector was designed and constructed for in situ X-ray absorption fine structure (XAFS) measurements of the su lfur-containing species formed during exposure of copper to a humid at mosphere containing SO2. Using the detector, gas phase XAFS spectra we re also collected for both dry and humid SO2 atmospheres. This work pr esents the experimental technique and examples of the sulfur K-edge sp ectra collected during the study.