SINGLE AND DOUBLE-IONIZATION OF HE BY HCI - A RECOIL ION MOMENTUM STUDY

Citation
P. Jardin et al., SINGLE AND DOUBLE-IONIZATION OF HE BY HCI - A RECOIL ION MOMENTUM STUDY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 98(1-4), 1995, pp. 363-366
Citations number
12
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
98
Issue
1-4
Year of publication
1995
Pages
363 - 366
Database
ISI
SICI code
0168-583X(1995)98:1-4<363:SADOHB>2.0.ZU;2-V
Abstract
Single and double ionisation of He by highly charged ions have given r ise to a huge amount of experimental as well as theoretical studies. T he advent of the new generation of recoil ion spectrometers, which beg in to provide experimental results in the field of ion-atom collisions , allow us to obtain a new insight into the ionisation mechanisms. We report for the first time angular and energy differential cross sectio ns for the production of He recoil ions. These results were obtained i n the intermediate energy range using a 6.7 MeV/u Xe44+ projectile bea m and a high resolution (better than 0.1 a.u.) recoil ion momentum spe ctrometer. They show strong differences in the momentum distributions of the recoil ions corresponding to the single and double ionisation p rocesses.