P. Jardin et al., SINGLE AND DOUBLE-IONIZATION OF HE BY HCI - A RECOIL ION MOMENTUM STUDY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 98(1-4), 1995, pp. 363-366
Single and double ionisation of He by highly charged ions have given r
ise to a huge amount of experimental as well as theoretical studies. T
he advent of the new generation of recoil ion spectrometers, which beg
in to provide experimental results in the field of ion-atom collisions
, allow us to obtain a new insight into the ionisation mechanisms. We
report for the first time angular and energy differential cross sectio
ns for the production of He recoil ions. These results were obtained i
n the intermediate energy range using a 6.7 MeV/u Xe44+ projectile bea
m and a high resolution (better than 0.1 a.u.) recoil ion momentum spe
ctrometer. They show strong differences in the momentum distributions
of the recoil ions corresponding to the single and double ionisation p
rocesses.