A. Billebaud et al., CARBON FOIL THICKNESS DEPENDENT ELECTRON YIELDS INDUCED BY SWIFT HIGHLY-CHARGED IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 98(1-4), 1995, pp. 492-496
We measured electron yields from the beam entrance and exit surfaces o
f thin carbon foils (d approximate to 4-700 mu g/cm(2)) bombarded with
swift (E(p)/M = 13.6 MeV/u) highly charged (q = 16-18) Ar ions. The d
ependence of the electron yields on target thickness d is analyzed wit
hin the framework of a phenomenological semiempirical model. We obtain
ed electron transport lengths of high energy (E much greater than 100
eV) delta-electrons and diffusion lengths of slow electrons (E much le
ss than 100 eV), The projectile velocity dependence of these transport
lengths is investigated by comparing our present results for 13.6 MeV
/u Ar with results obtained with 0.1 MeV/u Ne, 1 MeV/u C, 3.9 MeV/u S
and 74 MeV/u Ni. We also discuss the relation between electron yields
and the electronic stopping power.