LOW-TEMPERATURE EPITAXIAL-GROWTH AND PHOTOLUMINESCENCE CHARACTERIZATION OF GAN

Citation
A. Dissanayake et al., LOW-TEMPERATURE EPITAXIAL-GROWTH AND PHOTOLUMINESCENCE CHARACTERIZATION OF GAN, Applied physics letters, 65(18), 1994, pp. 2317-2319
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
65
Issue
18
Year of publication
1994
Pages
2317 - 2319
Database
ISI
SICI code
0003-6951(1994)65:18<2317:LEAPC>2.0.ZU;2-2
Abstract
Epitaxial layers of GaN on sapphire substrates have been grown by meta lorganic chemical-vapor deposition at a deposition temperature as low as 400 degrees C, which is the lowest temperature for successful epita xial growth of GaN by any technique. This is achieved by controlling t he low flow rate of the source gases and by first depositing an AIN bu ffer layer at 400 degrees C. Low-temperature photoluminescence measure ments have been employed to study the optical properties of the films deposited at different temperatures. (C) 1994 American Institute of Ph ysics.