CORRELATION BETWEEN LIGHT AND CURRENT-INDUCED DEGRADATION IN A-SI SOLAR-CELLS

Authors
YANAGISAWA T
Citation
T. Yanagisawa, CORRELATION BETWEEN LIGHT AND CURRENT-INDUCED DEGRADATION IN A-SI SOLAR-CELLS, Electronics Letters, 30(21), 1994, pp. 1802-1803
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
30
Issue
21
Year of publication
1994
Pages
1802 - 1803
Database
ISI
SICI code
0013-5194(1994)30:21<1802:CBLACD>2.0.ZU;2-5
Abstract
Long-term degradation tests were carried out on amorphous silicon sola r cells by light irradiation and current injection. The correlation of the degradation patterns and the lifetime estimation data in these tw o methods have confirmed the mutual stress conversion of light and cur rent intensity. It is possible to estimate the lifetime of solar cells .