STARK-EFFECT AND EXCITONIC TUNNELING ESCAPE PROCESS IN SEMICONDUCTOR QUANTUM-WELLS

Citation
A. Hernandezcabrera et al., STARK-EFFECT AND EXCITONIC TUNNELING ESCAPE PROCESS IN SEMICONDUCTOR QUANTUM-WELLS, Journal of applied physics, 76(9), 1994, pp. 4983-4988
Citations number
25
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
76
Issue
9
Year of publication
1994
Pages
4983 - 4988
Database
ISI
SICI code
0021-8979(1994)76:9<4983:SAETEP>2.0.ZU;2-3
Abstract
In this work, we have numerically integrated in space and time the eff ective mass Schrodinger equation for an exciton in a semiconductor qua ntum-well structure. Considering a Coulomb interaction between the ele ctron-hole pair and an external electric field, we have studied the ex citonic tunneling escape process from semiconductor quantum wells. Our method of calculation has been applied to types-I, -II, and -III quan tum-well superlattices. In addition, we present the calculated exciton ic lifetimes for the GaAs/GalAs, InAs/GaSb, and HgTe/HgCdTe systems un der an external electric field. In the HgTe/CdTe system, the possibili ty of having similar electron and hole lifetime values is also found i f the applied electric field is large enough.