METHOD OF X-RAY-FLUORESCENCE ANALYSIS OF THE LASER HETEROSTRUCTURES GAAS-GA1-XALXAS

Authors
LYAMINA OI KUPRIYANOVA TA
Citation
Oi. Lyamina et Ta. Kupriyanova, METHOD OF X-RAY-FLUORESCENCE ANALYSIS OF THE LASER HETEROSTRUCTURES GAAS-GA1-XALXAS, Industrial laboratory, 60(6), 1994, pp. 338-340
Citations number
14
Categorie Soggetti
Material Science","Metallurgy & Mining
Journal title
Industrial laboratory → ACNP
ISSN journal
00198447
Volume
60
Issue
6
Year of publication
1994
Pages
338 - 340
Database
ISI
SICI code
0019-8447(1994)60:6<338:MOXAOT>2.0.ZU;2-#
Abstract
A method of x-ray fluorescence analysis of films on substrates with th e use of single massive reference specimens is suggested. This method is based on the difference in penetrating abilities of primary and sec ondary x-rays of various series and elements and hence on the differen ce in the size of the information zone specified for different analyti cal x-ray lines and excitation conditions.