PHOTOLUMINESCENCE AND PASSIVATION OF SILICON NANOSTRUCTURES

Citation
Da. Redman et al., PHOTOLUMINESCENCE AND PASSIVATION OF SILICON NANOSTRUCTURES, Applied physics letters, 65(19), 1994, pp. 2386-2388
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
65
Issue
19
Year of publication
1994
Pages
2386 - 2388
Database
ISI
SICI code
0003-6951(1994)65:19<2386:PAPOSN>2.0.ZU;2-U
Abstract
A new method was used to fabricate nanometer-scale structures in Si fo r photoluminescence studies. Helium ions were implanted to form a dens e subsurface layer of small cavities (1-16 nm diameter). Implanted spe cimens subjected to annealing in a variety of atmospheres yielded no d etectable photoluminescence. However, implantation combined with elect rochemical anodization produced a substantial blueshift relative to an odization alone. This blueshift is consistent with the quantum confine ment model of photoluminescence in porous silicon. (C) American Instit ute of Physics.