ATOMIC-FORCE MICROSCOPY OF ELASTOMERS .1. CHARACTERIZATION OF CARBON-BLACK MORPHOLOGY AND DISPERSION IN ELASTOMERS BY NONCONTACT MODE AFM

The application of AC non-contact atomic force microscopy (AFM) is int roduced for the first time in order to investigate carbon black morpho logy and dispersion in elastomers. A brief discussion of the basic pri nciples of this new type of microscopy shows that non-contact mode AFM is superior to contact mode AFM when imaging materials of high compli ance. The technique is used to study the carbon black dispersion in tw o elastomeric materials of identical recipe but mixed by different pro cedures. The resultant images allow quantitative analyses of agglomera te/aggregate size, interagglomerate/interaggregate distance and even p rimary particle size distribution of carbon blacks in mixes. AFM Is a suitable method for a unique characterization of carbon black and sili ca dispersion.