NONDESTRUCTIVE IN-SITU ANALYSIS OF INTERFACE PROCESSES AND THIN-FILM GROWTH

Citation
M. Buck et al., NONDESTRUCTIVE IN-SITU ANALYSIS OF INTERFACE PROCESSES AND THIN-FILM GROWTH, Le Vide, les couches minces, (272), 1994, pp. 63-68
Citations number
9
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
ISSN journal
02234335
Issue
272
Year of publication
1994
Supplement
S
Pages
63 - 68
Database
ISI
SICI code
0223-4335(1994):272<63:NIAOIP>2.0.ZU;2-J
Abstract
The growth of polyamic acid films on polycrystalline gold substrates w as monitored with second harmonic generation (SHG). Pyromellitic dianh ydride (PMDA), 4,4'-oxydianiline (ODA) and 4,4'-diaminodiphenyl disulf ide (DAPS) served as monomers. Depending on the diamine the second har monic signal behaves very differently both during formation of the pol ymerimetal interface and the subsequent film growth. The experimental data are quantitatively described by a theoretical model which relates the SH signal to the orientation of the molecules. The model shows th at the shape of the thickness dependent second harmonic signal yields structural information about the film and hence, demonstrates that SHG can be applied as a technique to analyse the growth of thin films.