IR SPECTROSCOPIC STUDY OF VERY THIN PREPOLYMER FILMS ON SILICON AND ON ALUMINUM

Authors
POSSART W FANTER D HARTWIG A HENNEMAN OD BAUER M
Citation
W. Possart et al., IR SPECTROSCOPIC STUDY OF VERY THIN PREPOLYMER FILMS ON SILICON AND ON ALUMINUM, Le Vide, les couches minces, (272), 1994, pp. 354-357
Citations number
NO
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Le Vide, les couches minces → ACNP
ISSN journal
02234335
Issue
272
Year of publication
1994
Supplement
S
Pages
354 - 357
Database
ISI
SICI code
0223-4335(1994):272<354:ISSOVT>2.0.ZU;2-A
Abstract
External reflectance ir spectra of DCBA prepolymer layers between 5 Nm and 100 nm on Al and Si are interpreted in terms of a stratified laye r model. Orientation and intermolecular interaction of the triazine ri ng and its neighbourhood me influenced by the Al while the other parts of the molecules retain the bulk properties. The Si surface appears t o be nearly inert.