We investigate carrier capture and carrier transport in the InGaAs/InP
material system by luminescence spectroscopy with femtosecond time re
solution. Comparative studies are performed on samples of different we
ll width, barrier width and gallium mole fraction of the InGaAs layers
. The investigations focus on excitation conditions that are comparabl
e to those for semiconductor laser operation. Firm data on carrier dyn
amics are presented for these conditions. We find that the overall tra
nsfer rates of electrons and holes are similar and independent of well
width. Furthermore, the transfer times show a linear dependence on ba
rrier width. From experimental and model calculation results we derive
some guidelines for the design of high-frequency laser devices.