A high-accuracy spectrometer has been developed for measuring regular
spectral transmittance. The spectrometer is an automated, single-beam
instrument that is based on a grating monochromator, reflecting optics
, and an averaging sphere detector unit with a silicon photodiode. The
uncertainties related to wavelength calibration, detector nonlinearit
y, system instability, beam displacement, polarization, stray light, i
nterreflections, and beam uniformity are determined for the visible sp
ectral range from 380 to 780 nm. A total uncertainty of 3 x 10(-4) (1
sigma) is estimated for transmittance measurements of homogeneous neut
ral-density filters. The uncertainty of the wavelength scale is 0.06 n
m. As a specific application, calibration of V(lambda)-correction filt
ers is studied. To verify the accuracy of the transmittance measuremen
ts, a comparison of the measured and predicted transmittances of a sam
ple of high-purity fused silica is made, revealing agreement at the 5
x 10(-4) level.