Sp. Rawal et al., MECHANICAL-PROPERTIES AND MICROSTRUCTURE OF SPUTTER-DEPOSITED NB5SI3 NB MICROLAMINATES/, Journal of materials research, 10(7), 1995, pp. 1721-1729
Crystalline Nb5Si3/Nb microlaminates were fabricated to a thickness of
20 mu m by depositing the materials onto elevated temperature (750 de
grees C) substrates. Modulation wavelengths of the microlaminates were
varied (lambda = 40 and 200 nm) while holding their silicide volume f
raction constant to assess the effect of layer thickness on the compos
ite properties. X-ray and selected area diffraction confirmed that bot
h the metal and silicide layers exhibited a polycrystalline structure
in the as-deposited microlaminates. Nanoindentation measurements of bo
th microlaminates indicated that calculated elastic modulus values wer
e similar to the values obtained by the rule-of-mixtures (ROM). Nanoha
rdness values of the microlaminates increased with decreasing waveleng
th in a manner described by the Hall-Fetch relationship. Vickers hardn
ess (Hv) measurements were also found to be a function of the modulati
on wavelength, decreasing from 7.32 GPa at lambda = 40 nm to 3.04 GPa
at lambda = 200 nm. Even with a Nb volume fraction of 50%, the lambda
= 40 nm microlaminate and the monolithic Nb5Si3 film exhibited similar
Vickers hardness values of 7.5 GPa. These results show the significan
t role of modulation wavelength on the hardness, compressive strength,
and toughness characteristics of a microlaminate composite.