QUANTITATIVE XPS AND AFM SURFACE-ANALYSIS - STUDY OF A PATCHED GOLD OVERLAYER ON GRAPHITE

Authors
GOLLION P GRENET G
Citation
P. Gollion et G. Grenet, QUANTITATIVE XPS AND AFM SURFACE-ANALYSIS - STUDY OF A PATCHED GOLD OVERLAYER ON GRAPHITE, Surface and interface analysis, 23(6), 1995, pp. 404
Citations number
12
Categorie Soggetti
Chemistry Physical
Journal title
Surface and interface analysis → ACNP
ISSN journal
01422421
Volume
23
Issue
6
Year of publication
1995
Database
ISI
SICI code
0142-2421(1995)23:6<404:QXAAS->2.0.ZU;2-T
Abstract
A patched gold overlayer obtained by thermal evaporation on graphite w as investigated by x-ray photoelectron spectroscopy (XPS) and by atomi c force microscopy (AFM). The fraction of the substrate area covered b y gold and the overlayer thickness are deduced from XPS angular measur ements. These results are compared with topographic data as given by A FM.