DETERMINATION OF MILLER INDEXES OF SIDE FACES OF SMALL CRYSTALLITES FROM SCANNING FORCE MICROSCOPY ANGLE MEASUREMENTS

The calculation of Miller indices from out-of-plane angle measurements with scanning force microscopy (SFM) is demonstrated on three differe nt systems: rutile on haematite, rutile on sapphire and haematite on s apphire. The height of the investigated crystallites ranges from sever al millimetres (rutile on haematite) down to <10 nm (haematite on sapp hire). General issues of goniometry by means of SFM, such as the influ ence of the scanner calibration, the adjustment of the feedback loop o n the error involved in out-of-plane angle measurements and the limita tion of SFM goniometry due to tip geometry, are discussed and a compar ison with other methods are given.