A STUDY OF ALPHA-PARTICLE TRACK PROFILES BY MEANS OF CONFOCAL MICROSCOPY

Authors
GAIS P JAKES J SCHRAUBE H
Citation
P. Gais et al., A STUDY OF ALPHA-PARTICLE TRACK PROFILES BY MEANS OF CONFOCAL MICROSCOPY, Radiation measurements, 25(1-4), 1995, pp. 767-768
Citations number
3
Categorie Soggetti
Nuclear Sciences & Tecnology
Journal title
Radiation measurements → ACNP
ISSN journal
13504487
Volume
25
Issue
1-4
Year of publication
1995
Pages
767 - 768
Database
ISI
SICI code
1350-4487(1995)25:1-4<767:ASOATP>2.0.ZU;2-O
Abstract
The radial structures of etched tracks induced by randomly incidenting alpha-particles from radon and its progeny in the bare and 50 mu m po lyethylene covered samples, made of the CR-39 plastics, were studied b y means of the confocal imaging technique. The electrochemically etche d tracks were sequentially sectioned into (1-2) mu m optical sections and reconstructed in three-dimensional images. The morphometric parame ters of their radial cross-sections were measured.