COMPARISON OF POLYCRYSTALLINE CU(IN,GA)SE-2 DEVICE EFFICIENCY WITH JUNCTION DEPTH AND INTERFACIAL STRUCTURE

Authors
NELSON AJ GABOR AM CONTRERAS MA TUTTLE JR NOUFI R SOBOL PE ASOKAKUMAR P LYNN KG
Citation
Aj. Nelson et al., COMPARISON OF POLYCRYSTALLINE CU(IN,GA)SE-2 DEVICE EFFICIENCY WITH JUNCTION DEPTH AND INTERFACIAL STRUCTURE, Journal of applied physics, 78(1), 1995, pp. 269-272
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
78
Issue
1
Year of publication
1995
Pages
269 - 272
Database
ISI
SICI code
0021-8979(1995)78:1<269:COPCDE>2.0.ZU;2-J