AN X-RAY PHOTOELECTRON-SPECTROSCOPY AND WORK-FUNCTION STUDY OF THE ERALPHA-SIC(0001) INTERFACE/

Authors
KENNOU S
Citation
S. Kennou, AN X-RAY PHOTOELECTRON-SPECTROSCOPY AND WORK-FUNCTION STUDY OF THE ERALPHA-SIC(0001) INTERFACE/, Journal of applied physics, 78(1), 1995, pp. 587-589
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
78
Issue
1
Year of publication
1995
Pages
587 - 589
Database
ISI
SICI code
0021-8979(1995)78:1<587:AXPAWS>2.0.ZU;2-6