SEM AND XRD STUDIES OF CHEMICALLY DEPOSITED (CD-ZN)S FILMS

Authors
BHUSHAN S SHRIVASTAVA S
Citation
S. Bhushan et S. Shrivastava, SEM AND XRD STUDIES OF CHEMICALLY DEPOSITED (CD-ZN)S FILMS, Indian Journal of Pure & Applied Physics, 33(7), 1995, pp. 371-375
Citations number
NO
Categorie Soggetti
Physics
Journal title
Indian Journal of Pure & Applied Physics → ACNP
ISSN journal
00195596
Volume
33
Issue
7
Year of publication
1995
Pages
371 - 375
Database
ISI
SICI code
0019-5596(1995)33:7<371:SAXSOC>2.0.ZU;2-N
Abstract
SEM and XRD studies of undoped (Cd-Zn)S films and films doped with La are reported. Effects of annealing are also considered. The SEM microg raphs show cabbage (leafy) structure in some cases. A distribution of particles is observed which changes due to presence of impurities and on annealing. XRD studies show the crystalline nature, the intensity o f peaks generally decreases with increasing Zn content and annealing. The changes occurring due to presence of impurities are also discussed .