VISUALIZATION OF ACOUSTIC FIELDS IN SURFACE-ACOUSTIC-WAVE DEVICES BY MEANS OF X-RAY TOPOGRAPHY

Citation
E. Zolotoyabko et al., VISUALIZATION OF ACOUSTIC FIELDS IN SURFACE-ACOUSTIC-WAVE DEVICES BY MEANS OF X-RAY TOPOGRAPHY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 97(1-4), 1995, pp. 346-350
Citations number
9
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
97
Issue
1-4
Year of publication
1995
Pages
346 - 350
Database
ISI
SICI code
0168-583X(1995)97:1-4<346:VOAFIS>2.0.ZU;2-5
Abstract
Reflection X-ray topographs from acousto-optic devices were measured u nder surface acoustic wave excitation. Enhanced sensitivity to small u ltrasound amplitudes was achieved when the ultrasound wavelength was s horter than the X-ray extinction length. Under this condition an X-ray diffraction image of a high-frequency traveling surface acoustic wave was obtained despite the strains in the device caused by microelectro nic processing.