Mrh. Khan et al., THE BARRIER HEIGHT AND INTERFACE EFFECT OF A AU-N-GAN SCHOTTKY DIODE, Journal of physics. D, Applied physics, 28(6), 1995, pp. 1169-1174
Schottky barrier contact using Au and ohmic contact using Al were made
on n-GaN grown by hydride vapour phase epitaxy. The diodes were chara
cterized in the range 77-373 K. Under forward bias, the ideality param
eter n = 1.04 and the threshold voltage is 1.1 V. The reverse bias lea
k current is below 10(-9) A on a reverse bias of -10 V. The temperatur
e-dependence of the I-V characteristics shows two regimes of forward c
urrent transport: one at low voltage governed by thermionic emission a
nd the high-voltage regime due to spatial inhomogeneities at the metal
-semiconductor interface. The barrier height phi(B) and the electron a
ffinity X(S) were determined to be 0.91 and 4.19 eV, respectively, by
I-V measurement; and 1.01 +/- 0.02 and 4.09 eV, respectively, by C-V m
easurement. The results have been discussed.