Ja. Sanchezgil et al., LIMITS OF VALIDITY OF 3 PERTURBATION THEORIES OF THE SPECULAR SCATTERING OF LIGHT FROM ONE-DIMENSIONAL, RANDOMLY ROUGH, DIELECTRIC SURFACES, Journal of the Optical Society of America. A, Optics, image science,and vision., 12(7), 1995, pp. 1547-1558
The reflectivity of p- and s-polarized light incident upon a one-dimen
sional, randomly rough, dielectric surface is calculated for several a
ngles of incidence, when the plane of incidence is normal to the gener
ators of the surface, by a second-order small-amplitude perturbation t
heory, by a second-order self-energy perturbation theory, and by a sec
ond-order phase perturbation theory. The wavelength of the incident li
ght is lambda = 0.6328 mu m, and the dielectric constant of the scatte
ring medium is epsilon = 2.25. The surface roughness is characterized
by a rms height delta and a transverse correlation length a. From a co
mparison of the results of these approximate calculations with those o
btained by a numerical simulation approach for each polarization of th
e incident light, and for several angles of incidence, curves of delta
/lambda as a function of a/lambda are constructed, below which each pe
rturbative method is valid with an error that is smaller than 2.5%. It
is found that, for a given value of a/lambda, the reflectivity of s-
and p-polarized light is given most accurately by the phase perturbati
on theory and least accurately by small-amplitude perturbation theory.