670-NM ALGAINP GAINP STRAINED MULTIQUANTUM-WELL LASER-DIODE WITH HIGHCHARACTERISTIC TEMPERATURE (T(0))

Citation
Js. Kim et al., 670-NM ALGAINP GAINP STRAINED MULTIQUANTUM-WELL LASER-DIODE WITH HIGHCHARACTERISTIC TEMPERATURE (T(0)), Optical and quantum electronics, 27(5), 1995, pp. 435-440
Citations number
20
Categorie Soggetti
Optics,"Engineering, Eletrical & Electronic
ISSN journal
03068919
Volume
27
Issue
5
Year of publication
1995
Pages
435 - 440
Database
ISI
SICI code
0306-8919(1995)27:5<435:6AGSML>2.0.ZU;2-H
Abstract
A 670 nm AlGalnP/GalnP strained multi-quantum well laser diode with a high characteristic temperature (T0) has been achieved by optimization of quantum well structures and the metal-organic chemical vapour depo sition process. The hole concentration of 5 x 10(17) cm-3 in the p-AlG alnP cladding layer on a (100) 5-degrees off GaAs substrate has been o btained with very small ratio, 0.35, of mole flow rate of zinc source to the group III sources ([DEZn]/[III] of 0.35. The threshold current and maximum temperature for continuous wave operation of lasers with c avity length of 300 mum have been measured as 45 mA and 80-degrees-C, respectively. The characteristic temperature (T0) of the lasers has be en measured as high as 153 K. The laser without facet protections coul d operate for more than 1000h at 50-degrees-C and 5 mW.