Js. Kim et al., 670-NM ALGAINP GAINP STRAINED MULTIQUANTUM-WELL LASER-DIODE WITH HIGHCHARACTERISTIC TEMPERATURE (T(0)), Optical and quantum electronics, 27(5), 1995, pp. 435-440
A 670 nm AlGalnP/GalnP strained multi-quantum well laser diode with a
high characteristic temperature (T0) has been achieved by optimization
of quantum well structures and the metal-organic chemical vapour depo
sition process. The hole concentration of 5 x 10(17) cm-3 in the p-AlG
alnP cladding layer on a (100) 5-degrees off GaAs substrate has been o
btained with very small ratio, 0.35, of mole flow rate of zinc source
to the group III sources ([DEZn]/[III] of 0.35. The threshold current
and maximum temperature for continuous wave operation of lasers with c
avity length of 300 mum have been measured as 45 mA and 80-degrees-C,
respectively. The characteristic temperature (T0) of the lasers has be
en measured as high as 153 K. The laser without facet protections coul
d operate for more than 1000h at 50-degrees-C and 5 mW.