ANALYSIS OF ROLLING-CONTACT FATIGUED MICROSTRUCTURE USING FOCUSED ION-BEAM SPUTTERING AND TRANSMISSION ELECTRON-MICROSCOPY OBSERVATION

Authors
MUROGA A SAKA H
Citation
A. Muroga et H. Saka, ANALYSIS OF ROLLING-CONTACT FATIGUED MICROSTRUCTURE USING FOCUSED ION-BEAM SPUTTERING AND TRANSMISSION ELECTRON-MICROSCOPY OBSERVATION, Scripta metallurgica et materialia, 33(1), 1995, pp. 151-156
Citations number
4
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
Journal title
Scripta metallurgica et materialia → ACNP
ISSN journal
0956716X
Volume
33
Issue
1
Year of publication
1995
Pages
151 - 156
Database
ISI
SICI code
0956-716X(1995)33:1<151:AORFMU>2.0.ZU;2-1