Di. Milburn et Kgt. Hollands, AN ANALYSIS OF THICK-SAMPLE EFFECTS IN THE MEASUREMENT OF DIRECTIONAL-HEMISPHERICAL TRANSMITTANCE, Optics communications, 118(1-2), 1995, pp. 1-8
Materials that are both thick and scatter light pose special problems
in the measurement of transmittance. Traditional small-beam measuremen
t techniques are not, in general, accurate when used with this type of
material, due to the lateral displacement of light as it is transmitt
ed. The technique of transmittance measurement using broad-area irradi
ation can overcome this lateral-displacement problem, but it is subjec
t to certain errors caused by non-uniformity of the irradiation. This
paper examines the problems associated with transmittance measurements
on thick and scattering samples in both small-area and broad-area irr
adiation techniques and develops methods for determining the errors as
sociated with each type of measurement.