SECONDARY MOLECULAR ION EMISSION FROM ALIPHATIC POLYMERS BOMBARDED WITH LOW-ENERGY IONS - EFFECTS OF THE MOLECULAR-STRUCTURE AND THE ION-BEAM-INDUCED SURFACE DEGRADATION
A. Delcorte et al., SECONDARY MOLECULAR ION EMISSION FROM ALIPHATIC POLYMERS BOMBARDED WITH LOW-ENERGY IONS - EFFECTS OF THE MOLECULAR-STRUCTURE AND THE ION-BEAM-INDUCED SURFACE DEGRADATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 100(2-3), 1995, pp. 213-216
The influence of the molecular structure on the secondary ion producti
on is studied for three saturated aliphatic polymers (low-density poly
ethylene, polypropylene and polyisobutylene) bombarded with low energy
ions. These polymers differ only by the presence and nature of the pe
ndant group. The intensities of the most characteristic secondary mole
cular ions are followed as a function of the primary ion dose in the (
10(12) ions/cm(2)-10(14) ions/cm(2)) range for two primary ion bombard
ment conditions (4 keV Xe+ and 15 keV Ga+). The results show that ther
e is a direct relationship between the polymer degradation and the emi
ssion of molecular fragments. No truly ''static'' conditions are found
, rather, the polymer surface undergoes a continuous transformation un
der ion beam bombardment. The most spectacular effect is its dehydroge
nation. By rationalizing the competition between the two related proce
sses, surface degradation and molecular ion production, a kinetic mode
l is proposed in order to explain the behavior of molecular fragments
belonging to the C8 cluster.