T. Lill et al., SPUTTERING OF TIN AND GALLIUM-TIN CLUSTERS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 100(2-3), 1995, pp. 361-365
Tin and gallium-tin clusters have been produced by 4 keV Ar+ ion bomba
rdment of polycrystalline tin and the gallium-tin eutectic alloy and a
nalyzed by time-of-flight mass spectrometry. The sputtered neutral spe
cies were photoionized with 193 nm (6.4 eV) excimer laser light. Neutr
al tin clusters containing up to 10 atoms and mixed gallium-tin cluste
rs Ga-(n-m)Sn-m with n less than or equal to 4 for the neutrals and n
less than or equal to 3 for the sputtered ionic species have been dete
cted. The measured distributions of mixed clusters with equal nucleari
ty have been found to be nonstatistical most likely due to significant
differences in the ionization efficiencies of clusters with equal nuc
learity but different tin content.