Rg. Kaercher et al., LUMINESCENCE OF SELF-TRAPPED EXCITONS INDUCED BY SINGLE KEV ION-BOMBARDMENT, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 100(2-3), 1995, pp. 383-388
We have studied the light emission from CsI and NH4Cl films that were
bombarded simultaneously with H-, low mass organic, and (CsII- (n = 0-
2) ions in the keV energy range (25-45 keV) at room temperature. Photo
ns were detected from the impact of individual primary ions with a sin
gle photon counting photomultiplier, and were analyzed using time reso
lved and wavelength analysis. For CsI, fast (tau less than or equal to
12 ns) and slow (tau greater than or equal to 650 ns) component decay
s were observed for all projectiles used. The fast component's emissio
n was similar to 300 nm while the slow component's emission was in the
visible. Only a fast component (tau < 3 ns) was observed in the UV re
gion for NH4Cl. Our data suggest that the light emission from both sam
ples is due to the radiative relaxation of serf-trapped excitons which
are produced by electronic interactions between the primary ions and
the target atoms.