CHARACTERIZATION OF BURIED THIN-FILMS WITH RESONANT SOFT-X-RAY FLUORESCENCE

Authors
CARLISLE JA TERMINELLO LJ HUDSON EA PERERA RCC UNDERWOOD JH CALLCOTT TA JIA JJ EDERER DL HIMPSEL FJ SAMANT MG
Citation
Ja. Carlisle et al., CHARACTERIZATION OF BURIED THIN-FILMS WITH RESONANT SOFT-X-RAY FLUORESCENCE, Applied physics letters, 67(1), 1995, pp. 34-36
Citations number
19
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
67
Issue
1
Year of publication
1995
Pages
34 - 36
Database
ISI
SICI code
0003-6951(1995)67:1<34:COBTWR>2.0.ZU;2-7