ANALYSIS OF TI-LINBO3 WAVE-GUIDES USING SECONDARY-ION MASS-SPECTROMETRY AND NEAR-FIELD METHOD

Authors
CACCAVALE F GONELLA F QUARANTA A MANSOUR I
Citation
F. Caccavale et al., ANALYSIS OF TI-LINBO3 WAVE-GUIDES USING SECONDARY-ION MASS-SPECTROMETRY AND NEAR-FIELD METHOD, Electronics Letters, 31(13), 1995, pp. 1054-1056
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
31
Issue
13
Year of publication
1995
Pages
1054 - 1056
Database
ISI
SICI code
0013-5194(1995)31:13<1054:AOTWUS>2.0.ZU;2-Z
Abstract
Secondary ion mass spectrometry and the propagating-mode near-field me thod have been used to determine the Ti concentration and refractive i ndex profiles, respectively, of Ti:LiNbO3 channel waveguides. The nonl inear relationship between index change and dopant concentration is de termined.