Vb. Bobruiko et al., DIFFUSION OF CADMIUM IN LEAD-TELLURIDE, Materials science & engineering. B, Solid-state materials for advanced technology, 32(1-2), 1995, pp. 7-10
In order to determine the diffusion coefficient of cadmium in lead tel
luride D-Cd, CdTe/PbTe heterostructures were prepared by hot wall epit
axy. To obtain the cadmium concentration profile, quantitative Auger e
lectron spectroscopy (AES) and sputtered-neutral mass spectroscopy (SN
MS) were used. The data on the cadmium depth profile were used for eva
luation of the dependence of D-Cd on temperature at low temperatures (
350-450 degrees C) in heterostructures. The data obtained for D-Cd vs.
temperature are close to those calculated using the equation known fo
r higher temperatures.