IN-SITU MEASUREMENT OF ZINC-OXIDE FILM THICKNESS AND OPTICAL LOSSES

Authors
WACOGNE B PANNELL CN ROE MP PATTINSON TJ
Citation
B. Wacogne et al., IN-SITU MEASUREMENT OF ZINC-OXIDE FILM THICKNESS AND OPTICAL LOSSES, Applied physics letters, 67(2), 1995, pp. 161-163
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
67
Issue
2
Year of publication
1995
Pages
161 - 163
Database
ISI
SICI code
0003-6951(1995)67:2<161:IMOZFT>2.0.ZU;2-6