BEAM ANALYSIS SYSTEM FOR TEXAS A-AND-M K500 CYCLOTRON

A beam analysis system has been designed to provide a dispersion of 19 .3 cm per % Delta P/P with an ultimate aberration limited resolution o f Delta E/E up to 1/2500 for the full emittance of beams from the Texa s A&M K500 cyclotron. Both dispersion matched and slit limited solutio ns for beam delivered to the MDM spectrometer were obtained. A total o f 175 degrees of bend, in opposite direction 88 and 87 degree segments , is used with an intermediate focus between the segments. The first h alf may be used as a lower resolution analysis system with the second half serving to remove slit scattered particles so that a very clean b eam can be transported to the MDM spectrometer for zero degree inelast ic scattering measurements. The system is designed to use seven small inexpensive n = 0 dipoles with eight quadrupoles to provide focusing. Techniques for tuning are developed and the stability of the solutions with small changes in focusing are explored.