R. Steiner et al., IMAGING SIMS FOR THE INVESTIGATION OF SUBSTRATE SURFACES FOR CVD DIAMOND DEPOSITION, Fresenius' journal of analytical chemistry, 352(3-4), 1995, pp. 313-317
The influence of substrate surface preparation on diamond nucleation i
s a major topic in the investigation of CVD-diamond deposition. The su
bstrate, polishing material, its grain size, and the resulting surface
roughness all influence diamond nucleation. Diamond can nucleate at s
cratches or residues of the polishing process which are providing nucl
eation sites. In this paper the surface of molybdenum and substrates p
olished with SiC and diamond powder was studied by imaging (2- and 3-d
imensional) secondary ion mass spectrometry. The distribution and grai
n size of polishing residues (SiC, diamond) were determined and the re
action of diamond with the substrate during heating to deposition temp
erature was investigated. In this case a laterally inhomogeneous syste
m of carbon containing species had to be characterized. Therefore comp
ound-specific secondary ion mass spectrometry had to be performed. The
results suggested that diamond residues on molybdenum substrates are
partly dissolved during the heat treatment. The measurements indicate
that a fraction of the diamond residues is still present after heat tr
eatment and can provide nucleation sites for diamond deposition.