IMAGING SIMS FOR THE INVESTIGATION OF SUBSTRATE SURFACES FOR CVD DIAMOND DEPOSITION

Citation
R. Steiner et al., IMAGING SIMS FOR THE INVESTIGATION OF SUBSTRATE SURFACES FOR CVD DIAMOND DEPOSITION, Fresenius' journal of analytical chemistry, 352(3-4), 1995, pp. 313-317
Citations number
11
Categorie Soggetti
Chemistry Analytical
ISSN journal
09370633
Volume
352
Issue
3-4
Year of publication
1995
Pages
313 - 317
Database
ISI
SICI code
0937-0633(1995)352:3-4<313:ISFTIO>2.0.ZU;2-B
Abstract
The influence of substrate surface preparation on diamond nucleation i s a major topic in the investigation of CVD-diamond deposition. The su bstrate, polishing material, its grain size, and the resulting surface roughness all influence diamond nucleation. Diamond can nucleate at s cratches or residues of the polishing process which are providing nucl eation sites. In this paper the surface of molybdenum and substrates p olished with SiC and diamond powder was studied by imaging (2- and 3-d imensional) secondary ion mass spectrometry. The distribution and grai n size of polishing residues (SiC, diamond) were determined and the re action of diamond with the substrate during heating to deposition temp erature was investigated. In this case a laterally inhomogeneous syste m of carbon containing species had to be characterized. Therefore comp ound-specific secondary ion mass spectrometry had to be performed. The results suggested that diamond residues on molybdenum substrates are partly dissolved during the heat treatment. The measurements indicate that a fraction of the diamond residues is still present after heat tr eatment and can provide nucleation sites for diamond deposition.