The demand for manufacturing-ready systems and methods has fostered th
e development of a chemical mechanical polishing (CMP) infrastructure
that did not exist as little as five years ago. Several CMP-related to
pics were discussed in the April 1995 issue of Solid State Technology.
The following article discusses issues related to the manufacturing i
mplementation of CMP for planarization: the logistics associated with
volume production of a CMP process sector, design considerations for C
MP integration, technologies being developed for endpoint detection an
d other CMP-specific metrology, and slurry distribution and its dispos
al.