EMERGING DEVELOPMENTS IN CMP FOR SEMICONDUCTOR PLANARIZATION .2.

Authors
Citation
Ma. Fury, EMERGING DEVELOPMENTS IN CMP FOR SEMICONDUCTOR PLANARIZATION .2., Solid state technology, 38(7), 1995, pp. 81
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
0038111X
Volume
38
Issue
7
Year of publication
1995
Database
ISI
SICI code
0038-111X(1995)38:7<81:EDICFS>2.0.ZU;2-Q
Abstract
The demand for manufacturing-ready systems and methods has fostered th e development of a chemical mechanical polishing (CMP) infrastructure that did not exist as little as five years ago. Several CMP-related to pics were discussed in the April 1995 issue of Solid State Technology. The following article discusses issues related to the manufacturing i mplementation of CMP for planarization: the logistics associated with volume production of a CMP process sector, design considerations for C MP integration, technologies being developed for endpoint detection an d other CMP-specific metrology, and slurry distribution and its dispos al.