EFFECT PROFILE INDUCED BY FRICTION AND WEAR PROCESSES DETECTED BY POSITRON-ANNIHILATION METHOD

Authors
DRYZEK J DRYZEK E CLEFF B
Citation
J. Dryzek et al., EFFECT PROFILE INDUCED BY FRICTION AND WEAR PROCESSES DETECTED BY POSITRON-ANNIHILATION METHOD, Acta Physica Polonica. A, 88(1), 1995, pp. 129-133
Citations number
7
Categorie Soggetti
Physics
Journal title
Acta Physica Polonica. A → ACNP
ISSN journal
05874246
Volume
88
Issue
1
Year of publication
1995
Pages
129 - 133
Database
ISI
SICI code
0587-4246(1995)88:1<129:EPIBFA>2.0.ZU;2-#
Abstract
The positron annihilation studies of defect profile in Cu samples whos e surfaces were exposed to the friction and wear processes are present ed. The values of tile S-parameter and its dependences on the depth fr om the Cu surface are the functions of the value of the load applied i n the sliding contact between two metals. It indicates possibilities o f applying the presented measurement method in the industry.