J. Dryzek et al., EFFECT PROFILE INDUCED BY FRICTION AND WEAR PROCESSES DETECTED BY POSITRON-ANNIHILATION METHOD, Acta Physica Polonica. A, 88(1), 1995, pp. 129-133
The positron annihilation studies of defect profile in Cu samples whos
e surfaces were exposed to the friction and wear processes are present
ed. The values of tile S-parameter and its dependences on the depth fr
om the Cu surface are the functions of the value of the load applied i
n the sliding contact between two metals. It indicates possibilities o
f applying the presented measurement method in the industry.