HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY OF ZNTE LAYERS AT ELEVATED-TEMPERATURES

Authors
BOCHNICEK Z HOLY V WOLF K STANZL H GEBHARDT W
Citation
Z. Bochnicek et al., HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY OF ZNTE LAYERS AT ELEVATED-TEMPERATURES, Journal of applied physics, 78(2), 1995, pp. 862-867
Citations number
29
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
78
Issue
2
Year of publication
1995
Pages
862 - 867
Database
ISI
SICI code
0021-8979(1995)78:2<862:HXOZLA>2.0.ZU;2-Y