CHARACTERIZATION OF THE PRIMARY RECRYSTAL LIZATION TEXTURE OF AN IRON3-PERCENT-SILICON SHEET OF HIB GRADE

To simulate the abnormal growth of Goss grains in Fe 3% Si sheets of H iB grade, from the energy and the mobility anisotropies, it is so nece ssary to characterize the material texture at the primary recristalliz ation state, which is an important data of this simulation. From pole figures measured by X ray diffraction, the volume fraction of crystall ographic texture components are estimated using the harmonic and vecto r methods. Then, the obtained results are compared in the same space w hich is that of the vector method.