INCLUSION OF THE EFFECT OF THE GAP BETWEE N AN ATTACHED DEVICE AND THE PRODUCT IN MAGNETIC-STRUCTURE INSPECTION

Citation
Va. Zakharov et al., INCLUSION OF THE EFFECT OF THE GAP BETWEE N AN ATTACHED DEVICE AND THE PRODUCT IN MAGNETIC-STRUCTURE INSPECTION, Russian journal of nondestructive testing, 30(6), 1994, pp. 440-447
Citations number
6
Categorie Soggetti
Materials Science, Characterization & Testing
ISSN journal
10618309
Volume
30
Issue
6
Year of publication
1994
Pages
440 - 447
Database
ISI
SICI code
1061-8309(1994)30:6<440:IOTEOT>2.0.ZU;2-0
Abstract
A method is proposed for inspection of ferromagnetic products during m agnetization reversal along the return curve. In this method the readi ngs of the pickup of an attached magnetic device are independent of th e electromagnet-product gap over a wide range of demagnetizing fields (from partial demagnetization to magnetization in the opposite directi on).