S. Tougaard et A. Jablonski, TEST OF ELASTIC ELECTRON-SCATTERING CORRECTIONS FOR QUANTITATIVE XPS, Surface and interface analysis, 23(7-8), 1995, pp. 559-564
Ratios of the experimental XPS peak intensities from seven metals were
compared to two first-principle theories corresponding to neglecting
and including the effects of elastic electron scattering, i.e. the com
mon formalism and the Monte Carlo model, respectively, The theoretical
peak intensities were found to change by an average of 14% as a resul
t of elastic scattering, but the standard deviation from experiment wa
s practically the same, namely similar to 15% for both theories. The d
eviation between experiment and theory is found to be random when elas
tic scattering is neglected, while a small systematic component is rev
ealed when elastic scattering effects are included. The fact that no g
eneral reduction is observed in the deviation between experiment and t
heory is attributed to the error originating from parameters like the
photoionization cross-sections and the inelastic electron mean free pa
ths, These errors apparently overshadow to a large extent the improvem
ents of including the effects of elastic electron scattering.