N. Khalil et Jsl. Leach, THE ANODIC-OXIDATION OF VALVE METALS .3. TRANSPORT PROCESSES AND THEIR CORRELATION WITH FILM CONTAMINATION BY FLUORIDE AS MEASURED BY XPS, Electrochimica acta, 40(11), 1995, pp. 1769-1772
The effect of fluoride ion incorporation on the ionic transport proces
ses during anodic oxidation of zirconium has been studied using an alp
ha-particle spectrometry technique. X-ray photo-electron spectroscopy
(XPS) measurements permit correlation between oxide composition and ch
anges in oxide properties. The incorporated fluoride ions appear to af
fect the oxide growth field, but not the ionic transport numbers.