Gy. Kolbasov et al., DISTRIBUTION OF CHARGE-CARRIER CONCENTRATION DERIVED FROM THE CURRENTOF AN ELECTROCHEMICAL REACTION IN GAAS-BASED STRUCTURES, Instruments and experimental techniques, 38(1), 1995, pp. 103-105
This paper describes a technique for measuring the distribution of car
rier concentration in thin epitaxial GaAs structures from the current
of the electro chemical reaction across the semiconductor-electrolyte
interface at zero bending of energy bands, this is verified by measuri
ng the current induced by strongly absorbed light. Structure layers ar
e etched off either photoelectrochemically or chemically.