SCANNING FORCE MICROSCOPY OF KI EXPOSED TO EXCITON-PRODUCING UV-LIGHT

Citation
Rm. Wilson et Rt. Williams, SCANNING FORCE MICROSCOPY OF KI EXPOSED TO EXCITON-PRODUCING UV-LIGHT, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 101(1-2), 1995, pp. 122-126
Citations number
6
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
101
Issue
1-2
Year of publication
1995
Pages
122 - 126
Database
ISI
SICI code
0168-583X(1995)101:1-2<122:SFMOKE>2.0.ZU;2-W
Abstract
Potassium iodide has been exposed to ultraviolet light while on a scan ning force microscope stage, both by retracting the tip a few mu m dur ing exposure and by continuous in situ exposure while imaging. Previou s studies are extended to significantly lower ambient humidity in this work, and the introduction of UV light under the cantilever is examin ed.