ELECTROCHEMICAL POTENTIAL MEASUREMENTS DURING THE CHEMICAL-MECHANICALPOLISHING OF COPPER THIN-FILMS

Citation
Jm. Steigerwald et al., ELECTROCHEMICAL POTENTIAL MEASUREMENTS DURING THE CHEMICAL-MECHANICALPOLISHING OF COPPER THIN-FILMS, Journal of the Electrochemical Society, 142(7), 1995, pp. 2379-2385
Citations number
11
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
142
Issue
7
Year of publication
1995
Pages
2379 - 2385
Database
ISI
SICI code
0013-4651(1995)142:7<2379:EPMDTC>2.0.ZU;2-A
Abstract
A description is given of the mixed electrochemical potential measured in situ during the chemical-mechanical polishing of copper. Potential measurements are indicative of the dissolution rate of copper and of the equilibrium form of the polished copper by-products. These measure ments are used to explain the polish performance in several ammonia-ba sed slurries. Specifically, the polish rate is shown to correlate with the potential and the change in potential during polishing. In additi on, complexing of copper ions with dissolved ammonia is discussed and shown to be ah effective method for increasing the solubility of coppe r ions in the slurry and thereby increasing the polish rate.