M. Jain et al., GROWTH AND XPS CHARACTERIZATION OF ANODIC TELLURIDE FILMS ON HG1-XCDXTE, Journal of the Electrochemical Society, 142(7), 1995, pp. 2480-2485
An anodic tellurization process to grow native telluride films on Hg1-
xCdxTe is described. This process requires two steps: first the growth
of an anodic sulfide/oxide film and second the conversion of this fil
m into an anodic telluride film. XPS studies suggest that the total co
nversion of the anodic sulfide/oxide film into an anodic telluride fil
m is possible. The concentration of tellurium in the anodically grown
telluride films can be controlled by controlling the concentration of
sulfur and oxygen in the starting film.